DocumentCode :
935135
Title :
A Ka-Band GaAs Monolithic Phase Shifter
Author :
Sokolov, Vladimir ; Geddes, John J. ; Contolatis, A. ; Bauhahn, Paul E. ; Chao, Chente
Volume :
31
Issue :
12
fYear :
1983
Firstpage :
1077
Lastpage :
1083
Abstract :
The design and performance of a GaAs monolithic 1800 one-bit switched line phase shifter test circuit for Ka-band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitic in the switching FET´s. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20° of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation.
Keywords :
Circuit testing; Delay effects; FETs; Fabrication; Gallium arsenide; Insertion loss; Phase measurement; Phase shifters; Switching circuits; Time measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1983.1131665
Filename :
1131665
Link To Document :
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