Title :
A Ka-Band GaAs Monolithic Phase Shifter
Author :
Sokolov, Vladimir ; Geddes, John J. ; Contolatis, A. ; Bauhahn, Paul E. ; Chao, Chente
Abstract :
The design and performance of a GaAs monolithic 1800 one-bit switched line phase shifter test circuit for Ka-band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitic in the switching FET´s. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20° of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation.
Keywords :
Circuit testing; Delay effects; FETs; Fabrication; Gallium arsenide; Insertion loss; Phase measurement; Phase shifters; Switching circuits; Time measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1983.1131665