DocumentCode :
935195
Title :
Sensitivity analysis of process variations for resonantly enhanced modulators on LiNbO3
Author :
Nguyen, Thach Giang ; Visagathilagar, Yuvaraja S. ; Mitchell, Arnan
Author_Institution :
Microelectron. & Mater. Technol. Centre, R. Melbourne Inst. of Technol., Vic., Australia
Volume :
24
Issue :
5
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
2199
Lastpage :
2206
Abstract :
A sensitivity analysis on the performance of resonantly enhanced modulators on X-cut LiNbO3 using a thick coplanar-waveguide electrode structure due to the fabrication tolerances is presented. The distributions of the various parameters to the performance fluctuation are analyzed. It is shown that a large-gap electrode makes the modulators less sensitive to the variations of electrode dimensions.
Keywords :
electro-optical modulation; electrodes; lithium compounds; LiNbO3; coplanar-waveguide electrode structure; resonantly enhanced modulator; sensitivity analysis; Bandwidth; Electrodes; Fluctuations; Optical attenuators; Optical mixing; Optical modulation; Optical sensors; Resonance; Resonant frequency; Sensitivity analysis; Optical communication; optical modulation; resonance; sensitivity;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2006.872270
Filename :
1632260
Link To Document :
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