DocumentCode :
935241
Title :
Conference Reports
Author :
Ravikumar, C.P. ; Nurmi, Jari
Author_Institution :
Texas Instruments
Volume :
24
Issue :
2
fYear :
2007
Firstpage :
202
Lastpage :
203
Abstract :
1. TTTC Forum honors Melvin Breuer--at the 2006 International Test Conference, a half-day technical forum was held to honor Melvin Breuer, a pioneer in the areas of VLSI design automation and test; 2. Design flow and methodology addressed at SOC 2006--The International Symposium on System-on-Chip took place on 13-16 November 2006 in Tampere, Finland. The theme was "SoC Design Flow and Methodology." There were nine high-caliber, 45-minute invited talks, covering different approaches and application areas in SoC design.
Keywords :
ITC; Melvin Breuer; SOC 2006; SoC design;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.39
Filename :
4237504
Link To Document :
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