• DocumentCode
    935241
  • Title

    Conference Reports

  • Author

    Ravikumar, C.P. ; Nurmi, Jari

  • Author_Institution
    Texas Instruments
  • Volume
    24
  • Issue
    2
  • fYear
    2007
  • Firstpage
    202
  • Lastpage
    203
  • Abstract
    1. TTTC Forum honors Melvin Breuer--at the 2006 International Test Conference, a half-day technical forum was held to honor Melvin Breuer, a pioneer in the areas of VLSI design automation and test; 2. Design flow and methodology addressed at SOC 2006--The International Symposium on System-on-Chip took place on 13-16 November 2006 in Tampere, Finland. The theme was "SoC Design Flow and Methodology." There were nine high-caliber, 45-minute invited talks, covering different approaches and application areas in SoC design.
  • Keywords
    ITC; Melvin Breuer; SOC 2006; SoC design;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2007.39
  • Filename
    4237504