DocumentCode
935241
Title
Conference Reports
Author
Ravikumar, C.P. ; Nurmi, Jari
Author_Institution
Texas Instruments
Volume
24
Issue
2
fYear
2007
Firstpage
202
Lastpage
203
Abstract
1. TTTC Forum honors Melvin Breuer--at the 2006 International Test Conference, a half-day technical forum was held to honor Melvin Breuer, a pioneer in the areas of VLSI design automation and test; 2. Design flow and methodology addressed at SOC 2006--The International Symposium on System-on-Chip took place on 13-16 November 2006 in Tampere, Finland. The theme was "SoC Design Flow and Methodology." There were nine high-caliber, 45-minute invited talks, covering different approaches and application areas in SoC design.
Keywords
ITC; Melvin Breuer; SOC 2006; SoC design;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.39
Filename
4237504
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