Title :
Effects of redundancy management on reliability modeling
Author :
Walker, Bruce K. ; Wereley, Norman M. ; Luppold, Robert H. ; Gai, Eliezer
Author_Institution :
Dept. of Aerosp. Eng. & Eng. Mech., Cincinnati Univ., OH, USA
fDate :
10/1/1989 12:00:00 AM
Abstract :
Two methods are investigated for incorporating the effects of fault detection and isolation (FDI) decision errors and redundancy management (RM) policy into reliability models for a simple single-component-dual-redundant system. These two methods are combinatorial analysis and Markov chain modeling. Reliability analysts have traditionally chosen the classical combinatorial approach. However, the authors show that the existence of time-ordered event sequences resulting from the interaction of FDI decision errors with the RM policy considerably complicates the construction of the combinatorial model. An error analysis illustrates that a simplified combinatorial model, which ignores these time-ordered event sequences, inaccurately predicts the system reliability. The Markov modeling technique is an excellent alternative to the combinatorial approach because it easily and accurately accounts for time-ordered event sequences such as those present in fault-tolerant systems
Keywords :
Markov processes; combinatorial mathematics; error analysis; redundancy; reliability theory; FDI decision errors; Markov chain modeling; combinatorial analysis; error analysis; fault detection and isolation; fault-tolerant systems; redundancy management; reliability models; single-component-dual-redundant system; time-ordered event sequences; Built-in self-test; Error analysis; Fault detection; Fault tolerant systems; Laboratories; Logic; Predictive models; Redundancy; Reliability; Technology management;
Journal_Title :
Reliability, IEEE Transactions on