• DocumentCode
    936007
  • Title

    The Latest Plasma-Enhanced Chemical-Vapor Deposition Technology for Large-Size Processing

  • Author

    Yang, Ya-Tang ; Won, Tae Kyung ; Choi, Soo Young ; Takehara, Takako ; Nishimura, Yasunori ; White, John M.

  • Author_Institution
    Appl. Mater. Co., Santa Clara
  • Volume
    3
  • Issue
    4
  • fYear
    2007
  • Firstpage
    386
  • Lastpage
    391
  • Abstract
    The thin-film transistor liquid crystal display (TFT-LCD) industry has in recent years demanded ever-larger- area substrate processing capability to keep up with consumer market demands for larger and larger displays. This paper discusses the latest plasma-enhanced chemical-vapor deposition (PECVD) system, the AKT 50 K PECVD, which handles up to 2160 x 2460 mm2 substrates. As substrate size increases, lowering the processing temperature is getting even more important to improve production reliability and cost performance. The most commonly used process temperature for the so-called active layers of amorphous silicon (a-Si) TFTs is approximately 350 degC. In this paper, a newly developed single-chamber low-temperature PECVD active-layers process is discussed. In particular, our low-temperature process maintains film performance at the same level as high-temperature active layers while also maintaining system productivity and throughput.
  • Keywords
    amorphous semiconductors; costing; liquid crystal displays; plasma CVD; semiconductor device manufacture; semiconductor device reliability; semiconductor thin films; silicon; thin film transistors; Si; TFT-LCD industry; consumer market; large-size processing; low-temperature PECVD active-layers process; plasma-enhanced chemical-vapor deposition technology; thin-film transistor liquid crystal display; Large-area deposition; liquid crystal display (LCD); plasma-enhanced chemical-vapor deposition (PECVD); thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Display Technology, Journal of
  • Publisher
    ieee
  • ISSN
    1551-319X
  • Type

    jour

  • DOI
    10.1109/JDT.2007.900912
  • Filename
    4356459