DocumentCode
936007
Title
The Latest Plasma-Enhanced Chemical-Vapor Deposition Technology for Large-Size Processing
Author
Yang, Ya-Tang ; Won, Tae Kyung ; Choi, Soo Young ; Takehara, Takako ; Nishimura, Yasunori ; White, John M.
Author_Institution
Appl. Mater. Co., Santa Clara
Volume
3
Issue
4
fYear
2007
Firstpage
386
Lastpage
391
Abstract
The thin-film transistor liquid crystal display (TFT-LCD) industry has in recent years demanded ever-larger- area substrate processing capability to keep up with consumer market demands for larger and larger displays. This paper discusses the latest plasma-enhanced chemical-vapor deposition (PECVD) system, the AKT 50 K PECVD, which handles up to 2160 x 2460 mm2 substrates. As substrate size increases, lowering the processing temperature is getting even more important to improve production reliability and cost performance. The most commonly used process temperature for the so-called active layers of amorphous silicon (a-Si) TFTs is approximately 350 degC. In this paper, a newly developed single-chamber low-temperature PECVD active-layers process is discussed. In particular, our low-temperature process maintains film performance at the same level as high-temperature active layers while also maintaining system productivity and throughput.
Keywords
amorphous semiconductors; costing; liquid crystal displays; plasma CVD; semiconductor device manufacture; semiconductor device reliability; semiconductor thin films; silicon; thin film transistors; Si; TFT-LCD industry; consumer market; large-size processing; low-temperature PECVD active-layers process; plasma-enhanced chemical-vapor deposition technology; thin-film transistor liquid crystal display; Large-area deposition; liquid crystal display (LCD); plasma-enhanced chemical-vapor deposition (PECVD); thin-film transistor (TFT);
fLanguage
English
Journal_Title
Display Technology, Journal of
Publisher
ieee
ISSN
1551-319X
Type
jour
DOI
10.1109/JDT.2007.900912
Filename
4356459
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