Title :
Adaption of directly measurable transistor noise parameters to computer-aided noise analysis
Author_Institution :
Danish Research Centre for Applied Electronics, Hoersholm, Denmark
Abstract :
A transistor is conveniently characterised by four real noise parameters available from outer-terminal measurements. This representation is easily implemented into a computer program for noise analysis. The Rothe-Dahlke noise circuit is used in connection with the adjoint-network concept, and no additional auxiliary nodes are required.
Keywords :
computer-aided circuit analysis; noise; transistors; Rothe Dahlke noise circuit; adjoint network concept; computer aided noise analysis; transistor noise parameters;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19760047
