DocumentCode
936144
Title
Genesys-Pro: innovations in test program generation for functional processor verification
Author
Adir, Allon ; Almog, Eli ; Fournier, Laurent ; Marcus, Eitan ; Rimon, Michal ; Vinov, Michael ; Ziv, Avi
Author_Institution
IBM Res. Lab., Haifa, Israel
Volume
21
Issue
2
fYear
2004
Firstpage
84
Lastpage
93
Abstract
Functional verification is widely recognized as the bottleneck of the hardware design cycle. With the ever-growing demand for greater performance and faster time to market, coupled with the exponential growth in hardware size, verification has become increasingly difficult. Although formal methods such as model checking and theorem proving have resulted in noticeable progress, these approaches apply only to the verification of relatively small design blocks or to very focused verification goals. Current industry practice is to use separate, automatic, random stimuli generators for processor- and multiprocessor-level verification. The generated stimuli, usually in the form of test programs, trigger architecture and microarchitecture events defined by a verification plan. MAC-based algorithms are well suited for the test program generation domain because they postpone heuristic decisions until after consideration of all architectural and testing-knowledge constraints. Geneysys-Pro is currently the main test generation tool for functional verification of IBM processors, including several complex processors. We´ve found that the new language considerably reduces the effort needed to define and maintain knowledge specific to an implementation and verification plan.
Keywords
automatic test pattern generation; formal verification; hardware description languages; Genesys-Pro tool; formal methods; functional processor verification; microarchitecture events; model checking; multiprocessor-level verification; processor-level verification; random stimuli generators; test program generation; theorem proving; verification plan; Computer languages; Design engineering; Engines; Knowledge engineering; Microprocessors; Power generation; Power system modeling; Spine; Technological innovation; Testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2004.1277900
Filename
1277900
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