A Bayes approach to simultaneous evaluation of similar assemblies

Author

Hart, Louis

Author_Institution

IBM, Research Triangle Park, NC, USA

Volume

38

Issue

4

fYear

1989

fDate

10/1/1989 12:00:00 AM

Firstpage

483

Lastpage

484

Abstract

Simultaneous qualification testing of similar electronic-assembly designs that have the same reliability objectives lends itself to a Bayes approach. The author presents a method for obtaining the number of units to be put on test (test units) and the number of survivors required for this problem. The Bayes approach can reduce the total number of test units. The similarity of any two assemblies can be qualified using projected failure rates of components common to each design and components that differ between them. Under binomial sampling, survival probabilities follow the conjugate beta distribution. Two systems of linear equations are developed. Their solutions are vectors that describe, for each design: (1) the number of test units, and (2) the minimum number of survivors to demonstrate the reliability objective

Keywords

Bayes methods; electronic equipment testing; reliability theory; Bayes approach; binomial sampling; conjugate beta distribution; electronic-assembly designs; linear equations; projected failure rates; reliability objectives; simultaneous qualification testing; survival probabilities; survivors; test units; Assembly; Design engineering; Electronic equipment testing; Life testing; Power system reliability; Qualifications; Reliability engineering; Sampling methods; Statistical analysis; Statistical distributions;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.46469

Filename

46469