Title :
Observation of the Josephson effect in unusually thin Dayem bridges
Author :
Froome, P.K.D. ; Beck, A.H.
Author_Institution :
University of Cambridge, Engineering Department, Cambridge, UK
Abstract :
The Josephson effect has been observed for Dayem bridges made in carefully prepared indium films, so thin that surface roughness would normally be expected to destroy such behaviour. These bridges have usefully high resistances of between 1 and 10 ¿.
Keywords :
Josephson junctions; superconducting thin films; In films; Josephson effect; surface roughness; thin Dayem bridges;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19760078
