Title :
Reasoning About Fault Diagnosis with LES
Author :
Laffey, Thomas J. ; Perkins, Walton A. ; Nguyen, Tin A.
Author_Institution :
Lockheed Palo Alto Research Laboratory, 092-10 B/257, 3251 Hanover St., Palo Alto, CA 94304.
fDate :
4/1/1986 12:00:00 AM
Keywords :
Artificial intelligence; Baseband; Circuit faults; Expert systems; Fault diagnosis; Laboratories; Printed circuits;
Journal_Title :
IEEE Expert
DOI :
10.1109/MEX.1986.5006493
