DocumentCode :
936698
Title :
C.W. oscillation with p+-p-n+ silicon IMPATT diodes in 200 GHz and 300 GHz bands
Author :
Ino, M. ; Ishibashi, Takayuki ; Ohmori, M.
Author_Institution :
NTT, Electrical Communication Laboratories, Musashino, Japan
Volume :
12
Issue :
6
fYear :
1976
Firstpage :
148
Lastpage :
149
Abstract :
Submillimetre-wave silicon single-drift-region IMPATT diodes with a p+¿p¿n+ structure have been fabricated by ion implantation. C.W. output powers of 7.5 mW at 285 GHz and 78 mW at 185 GHz were obtained. The maximum c.w. oscillation frequency observed was 394 GHz.
Keywords :
IMPATT diodes; ion implantation; semiconductor device manufacture; solid-state microwave devices; 200 GHz; 300 GHz; CW oscillation; CW output powers; ion implantation; p+-p-n+ Si IMPATT diodes; submillimetre wave Si single drift region IMPATT diodes;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19760115
Filename :
4239665
Link To Document :
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