• DocumentCode
    936754
  • Title

    Laser prototyping of MEMS structures and SiN cantilevers: experience teaching a practical undergraduate course

  • Author

    Moore, D.F. ; Williams, J.A.

  • Author_Institution
    Eng. Dept., Cambridge Univ., UK
  • Volume
    151
  • Issue
    2
  • fYear
    2004
  • fDate
    3/3/2004 12:00:00 AM
  • Firstpage
    54
  • Lastpage
    59
  • Abstract
    Bulk micromachining silicon to form microbeams is a common procedure in MEMS fabrication. A focused laser is used to cut patterns directly in a silicon nitride or silicon carbide mask layer to prototype new structures and test geometries. In the past two years this flexible approach has been used as the basis of a practical undergraduate course in which students (a) design shapes using CAD, (b) cut them using the laser system, (c) micromachine in a clean room using anisotropic wet etching, (d) take microscope images, and (e) use a mechanical profilometer to test the silicon nitride microbeams and measure the elastic modulus. This teaching approach is outlined and the utility of hands-on practical work in MEMS education is assessed.
  • Keywords
    electronic engineering education; elemental semiconductors; laser beam cutting; laser beam machining; laser materials processing; masks; micromachining; micromechanical devices; semiconductor epitaxial layers; silicon; silicon compounds; teaching; wide band gap semiconductors; MEMS education; MEMS fabrication; MEMS structures; Si; SiC; SiN; SiN cantilevers; bulk micromachining silicon; experience teaching; laser prototype; microbeams; practical undergraduate course; silicon carbide mask layer; silicon nitride mask layer;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20040046
  • Filename
    1278136