DocumentCode :
936754
Title :
Laser prototyping of MEMS structures and SiN cantilevers: experience teaching a practical undergraduate course
Author :
Moore, D.F. ; Williams, J.A.
Author_Institution :
Eng. Dept., Cambridge Univ., UK
Volume :
151
Issue :
2
fYear :
2004
fDate :
3/3/2004 12:00:00 AM
Firstpage :
54
Lastpage :
59
Abstract :
Bulk micromachining silicon to form microbeams is a common procedure in MEMS fabrication. A focused laser is used to cut patterns directly in a silicon nitride or silicon carbide mask layer to prototype new structures and test geometries. In the past two years this flexible approach has been used as the basis of a practical undergraduate course in which students (a) design shapes using CAD, (b) cut them using the laser system, (c) micromachine in a clean room using anisotropic wet etching, (d) take microscope images, and (e) use a mechanical profilometer to test the silicon nitride microbeams and measure the elastic modulus. This teaching approach is outlined and the utility of hands-on practical work in MEMS education is assessed.
Keywords :
electronic engineering education; elemental semiconductors; laser beam cutting; laser beam machining; laser materials processing; masks; micromachining; micromechanical devices; semiconductor epitaxial layers; silicon; silicon compounds; teaching; wide band gap semiconductors; MEMS education; MEMS fabrication; MEMS structures; Si; SiC; SiN; SiN cantilevers; bulk micromachining silicon; experience teaching; laser prototype; microbeams; practical undergraduate course; silicon carbide mask layer; silicon nitride mask layer;
fLanguage :
English
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2344
Type :
jour
DOI :
10.1049/ip-smt:20040046
Filename :
1278136
Link To Document :
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