مرکز منطقه ای اطلاع رساني علوم و فناوري - IRE Standards on Solid-State Devices: Methods of Testing Transistors, 1956

DocumentCode :

936795

Title :

IRE Standards on Solid-State Devices: Methods of Testing Transistors, 1956

Volume :

Issue :

fYear :

1956

Firstpage :

1542

Lastpage :

1561

Keywords :

Art; Circuit testing; Measurement standards; Particle measurements; Personnel; Semiconductor device testing; Solid state circuits; Standardization; Transistors; Voltage;

fLanguage :

English

Journal_Title :

Proceedings of the IRE

Publisher :

ieee

ISSN :

0096-8390

Type :

jour

DOI :

10.1109/JRPROC.1956.274874

Filename :

4051913

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=936795