• DocumentCode
    936795
  • Title

    IRE Standards on Solid-State Devices: Methods of Testing Transistors, 1956

  • Volume
    44
  • Issue
    11
  • fYear
    1956
  • Firstpage
    1542
  • Lastpage
    1561
  • Keywords
    Art; Circuit testing; Measurement standards; Particle measurements; Personnel; Semiconductor device testing; Solid state circuits; Standardization; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1956.274874
  • Filename
    4051913
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=936795