• DocumentCode
    937671
  • Title

    Closed-Form Symbol Error Probabilities of STBC and CDD MC-CDMA With Frequency-Correlated Subcarriers Over Nakagami- m Fading Channels

  • Author

    Lodhi, Afzal ; Said, Fatin ; Dohler, Mischa ; Aghvami, A. Hamid

  • Author_Institution
    AIRCOM Int., Leatherhead
  • Volume
    57
  • Issue
    2
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    962
  • Lastpage
    973
  • Abstract
    The performances of cyclic delay diversity and space-time block-coded multicarrier code-division multiple-access (MC-CDMA) systems operating in a Nakagami-m fading channel with correlated subcarriers are investigated. By using the moment-generating function of the correlated Nakagami-m random variable, explicit closed-form formulas for the exact average symbol error rate (SER) of M-ary signals for an MC-CDMA system employing the aforementioned diversity techniques are derived with a maximum ratio combining detection technique. The average SERs are expressed in terms of higher transcendental functions, such as the Gauss and Appell hypergeometric functions. Both numerical and simulation results are presented, showing excellent agreement.
  • Keywords
    Nakagami channels; block codes; code division multiple access; diversity reception; error statistics; space-time codes; CDD MC-CDMA; Nakagami-m fading channels; STBC; closed-form symbol error probabilities; cyclic delay diversity; frequency-correlated subcarriers; hypergeometric functions; maximum ratio combining detection technique; moment-generating function; space-time block-coded multicarrier code-division multiple-access systems; Cyclic delay diversity; Cyclic delay diversity (CDD); MC-CDMA system; Nakagami-$m$ fading channels; Nakagami-m fading channels; multicarrier code-division multiple-access (MC-CDMA) system; space–time block codes (STBCs); space-time block codes; symbol error rates; symbol error rates (SERs);
  • fLanguage
    English
  • Journal_Title
    Vehicular Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/TVT.2007.906355
  • Filename
    4357311