• DocumentCode
    937846
  • Title

    Microwave Point Contact Diode Responsivity Improvement through Surface Effects in Vacuum (Short Papers)

  • Author

    Kopeika, N.S. ; Hirsh, Israel ; Ravfogel, M.

  • Volume
    32
  • Issue
    10
  • fYear
    1984
  • fDate
    10/1/1984 12:00:00 AM
  • Firstpage
    1384
  • Lastpage
    1387
  • Abstract
    Desorption of air atoms from point contact diode surfaces via exposure to vacuum can give rise to significant changes in electronic characteristics. In the example considered, exposure of an X-band detector to a modest vacuum gives rise to a responsivity increase of about 80 percent for video and heterodyne detection. Experiments indicate that vacuum desorption of minority surface impurities increases the barrier height and decreases tunneling probability, thus increasing diode nonlinearity and making the diodes more nearly "ideal." The resulting relative increase of the thermionic emission current should decrease the effective shot-noise temperature, thus increasing the signal-to-noise ratio (SNR) even further.
  • Keywords
    Circuits; Dispersion; Electrons; Frequency dependence; Impedance; Microstrip; Microwave theory and techniques; Optical surface waves; Optical waveguides; Semiconductor diodes;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1984.1132856
  • Filename
    1132856