DocumentCode :
937882
Title :
Parametric modeling of integrated circuit interconnections
Author :
Siomacco, Edward M. ; Tummala, Murali
Author_Institution :
Dept. of Electr. & Comput. Eng., Naval Postgraduate Sch., Monterey, CA, USA
Volume :
39
Issue :
6
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
377
Lastpage :
382
Abstract :
A parametric approach to the modeling and characterization of high frequency losses and dispersive propagation on integrated-circuit (IC) interconnections is presented. An autoregressive moving-average (ARMA) model based on a lumped equivalent circuit of a lossy microstrip transmission line is proposed. Model parameters are estimated from on-wafer time-domain measurements using a weighted least squares (WLS) algorithm and an Elmore delay approximation technique. It is shown that the effective microstrip permittivity can be evaluated from the estimated ARMA model parameters. Experiment results are compared with computer simulations of the lumped equivalent circuit and ARMA parametric models
Keywords :
digital integrated circuits; equivalent circuits; integrated circuit technology; parameter estimation; semiconductor device models; strip lines; ARMA parametric models; Elmore delay approximation; IC interconnect; MMIC; WLS algorithm; autoregressive moving-average; dispersive propagation; effective microstrip permittivity; high frequency losses; high speed digital circuits; integrated circuit interconnections; lossy microstrip transmission line; lumped equivalent circuit; model parameters; on-wafer time-domain measurements; weighted least squares; Delay estimation; Equivalent circuits; Frequency; Integrated circuit interconnections; Integrated circuit modeling; Least squares approximation; Microstrip; Parameter estimation; Parametric statistics; Propagation losses;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7130
Type :
jour
DOI :
10.1109/82.145295
Filename :
145295
Link To Document :
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