DocumentCode :
938060
Title :
Analysis of multicomponent thin films on GaAs by anodic processes
Author :
El-Safti, A.F.A.B. ; Weiss, B.L. ; Hartnagel, H.L.
Author_Institution :
University of Newcastle upon Tyne, Department of Electrical & Electronic Engineering, Newcastle upon Tyne, UK
Volume :
12
Issue :
13
fYear :
1976
Firstpage :
322
Lastpage :
324
Abstract :
Results arc presented which show that Ge ions diffuse to the surface rather than the OH¿ ions diffusing into the sample during the anodisation of Ge and Al on GaAs. Anodisatiort has also been used to show the growth of GaAs during the alloying of t.f.e. ohmic contacts to GaAs.
Keywords :
III-V semiconductors; gallium arsenide; semiconductor device manufacture; thin films; GaAs; Ge ions; OH- ions; anodic processes; anodisation; multicomponent thin films;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19760247
Filename :
4239826
Link To Document :
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