DocumentCode :
938316
Title :
Complete Linear Characterization of Transistors from Low Throug very High Frequencies
Author :
Follingstad, Henry G.
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, N. J.
Issue :
1
fYear :
1957
fDate :
3/1/1957 12:00:00 AM
Firstpage :
49
Lastpage :
63
Keywords :
Admittance; Frequency measurement; Impedance measurement; Phase measurement; Telephony; Transmission line measurements; Transmission line theory; VHF circuits; Voltage; Zirconium;
fLanguage :
English
Journal_Title :
Instrumentation, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2260
Type :
jour
DOI :
10.1109/IRE-I.1957.5006670
Filename :
5006670
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=938316
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