DocumentCode :
938567
Title :
Influence of copper vapor contamination on dielectric properties of hot air at 300-3500 K in atmospheric pressure
Author :
Tanaka, Yasunori
Author_Institution :
Dept. of Electr. & Electron. Eng., Kanazawa Univ., Japan
Volume :
12
Issue :
3
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
504
Lastpage :
512
Abstract :
The influence of copper vapor contamination on the dielectric properties of hot air at atmospheric pressure was numerically predicted in heavy particle temperature range 300-3500 K. Dielectric properties of hot gases are very important for effective design of switching devices and other applications. Copper vapor is known to be injected from the electrodes into the hot gas during arc interruption in a circuit breaker, which may substantially affect the dielectric strength of the hot gas. Analysis of equilibrium composition for a hot air contaminated with copper vapor and computations of Boltzmann equation made it possible to study the dielectric properties of interest. The result indicates that 1.0% copper vapor contamination remarkably increases the effective ionization coefficient α~ and thereby decreases the critical electric field (E/N)cr drastically. This arises from a much lower ionization potential of the copper atom.
Keywords :
Boltzmann equation; atmospheric pressure; circuit-breaking arcs; contamination; copper; dielectric properties; electric fields; electric strength; electrodes; ionisation potential; switching; 300 to 3500 K; Boltzmann equation; arc interruption; atmospheric pressure; circuit breaker; copper contamination; critical electric field; dielectric properties; dielectric strength; electrodes; ionization coefficient; ionization potential; switching devices; Boltzmann equation; Circuit breakers; Contamination; Copper; Dielectric breakdown; Dielectric devices; Electrodes; Gases; Ionization; Temperature distribution;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2005.1453455
Filename :
1453455
Link To Document :
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