DocumentCode :
938600
Title :
Optimizing the performance of flat-surface, high-gradient vacuum insulators
Author :
Leopold, J.G. ; Dai, U. ; Finkelstein, Y. ; Weissman, E.
Author_Institution :
Appl. & Tech. Phys. Dept., RAFAEL, Haifa, Israel
Volume :
12
Issue :
3
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
530
Lastpage :
536
Abstract :
High-gradient insulators (HGI) are periodic assemblies of conducting and insulating layers that have been shown to withstand higher pulsed voltages in vacuum than homogeneous insulators of the same length. We carried out calculations and experimental studies to understand the effect of geometry on the performance of well-conditioned, flat-surface HGI assemblies. We tested stacks with several different values of I/M (where I is the axial length of an insulating layer and M is the length of a metal layer). The experiments showed that HGI performance was substantially better than conventional insulators for I/M<3 and somewhat worse for I/M>3. Numerical calculations of electron orbits showed: 1) that the electric fields in HGI assemblies may have the favorable property of sweeping charged particles away from the surface and 2) that electron multiplication on the surface is suppressed when I/M<3.
Keywords :
electron avalanches; high-voltage techniques; insulators; numerical analysis; optimisation; surface discharges; vacuum breakdown; vacuum insulation; charged particles sweeping; electric fields; electron avalanche; electron multiplication; electron orbits; flat-surface insulators; high voltage insulators; high-gradient vacuum insulators; homogeneous insulators; numerical analysis; optimization; surface suppression; vacuum surface breakdown; Assembly; Breakdown voltage; Dielectrics and electrical insulation; Electrons; Metal-insulator structures; Orbital calculations; Orbits; Surface cleaning; Surface discharges; Vacuum breakdown;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2005.1453458
Filename :
1453458
Link To Document :
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