DocumentCode
938603
Title
Pseudoexhaustively testable ASM-based designs of digital systems
Author
Green, D.H. ; Chughtai, M.A.
Author_Institution
University of Manchester Institute of Science and Technology, Department of Electrical Engineering and Electronics, Manchester, UK
Volume
134
Issue
5
fYear
1987
fDate
9/1/1987 12:00:00 AM
Firstpage
237
Lastpage
242
Abstract
The concept of pseudoexhaustive testing is combined with that of qualifier preselection to provide easily testable designs of digital systems based on the algorithmic state machine (ASM) method. The highly structured implementations resulting from direct synthesis procedures with modern programmable devices are augmented by the incorporation of a serial shadow state register to provide built-in testability. A basic general test procedure is outlined and some refinements for particular ASMs are discussed. These can be incorporated at little extra cost or loss of generality.
Keywords
VLSI; digital integrated circuits; integrated circuit testing; logic testing; ASM; VLSI; algorithmic state machine; built-in testability; digital circuits; digital systems; direct synthesis procedures; general test procedure; integrated circuits; nondestructive testing; programmable devices; pseudoexhaustive testing; qualifier preselection; serial shadow state register; testable designs;
fLanguage
English
Journal_Title
Computers and Digital Techniques, IEE Proceedings E
Publisher
iet
ISSN
0143-7062
Type
jour
DOI
10.1049/ip-e.1987.0039
Filename
4647152
Link To Document