• DocumentCode
    938603
  • Title

    Pseudoexhaustively testable ASM-based designs of digital systems

  • Author

    Green, D.H. ; Chughtai, M.A.

  • Author_Institution
    University of Manchester Institute of Science and Technology, Department of Electrical Engineering and Electronics, Manchester, UK
  • Volume
    134
  • Issue
    5
  • fYear
    1987
  • fDate
    9/1/1987 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    242
  • Abstract
    The concept of pseudoexhaustive testing is combined with that of qualifier preselection to provide easily testable designs of digital systems based on the algorithmic state machine (ASM) method. The highly structured implementations resulting from direct synthesis procedures with modern programmable devices are augmented by the incorporation of a serial shadow state register to provide built-in testability. A basic general test procedure is outlined and some refinements for particular ASMs are discussed. These can be incorporated at little extra cost or loss of generality.
  • Keywords
    VLSI; digital integrated circuits; integrated circuit testing; logic testing; ASM; VLSI; algorithmic state machine; built-in testability; digital circuits; digital systems; direct synthesis procedures; general test procedure; integrated circuits; nondestructive testing; programmable devices; pseudoexhaustive testing; qualifier preselection; serial shadow state register; testable designs;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings E
  • Publisher
    iet
  • ISSN
    0143-7062
  • Type

    jour

  • DOI
    10.1049/ip-e.1987.0039
  • Filename
    4647152