Title :
Pseudoexhaustively testable ASM-based designs of digital systems
Author :
Green, D.H. ; Chughtai, M.A.
Author_Institution :
University of Manchester Institute of Science and Technology, Department of Electrical Engineering and Electronics, Manchester, UK
fDate :
9/1/1987 12:00:00 AM
Abstract :
The concept of pseudoexhaustive testing is combined with that of qualifier preselection to provide easily testable designs of digital systems based on the algorithmic state machine (ASM) method. The highly structured implementations resulting from direct synthesis procedures with modern programmable devices are augmented by the incorporation of a serial shadow state register to provide built-in testability. A basic general test procedure is outlined and some refinements for particular ASMs are discussed. These can be incorporated at little extra cost or loss of generality.
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; logic testing; ASM; VLSI; algorithmic state machine; built-in testability; digital circuits; digital systems; direct synthesis procedures; general test procedure; integrated circuits; nondestructive testing; programmable devices; pseudoexhaustive testing; qualifier preselection; serial shadow state register; testable designs;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
DOI :
10.1049/ip-e.1987.0039