Title :
Online clustering algorithms for radar emitter classification
Author :
Liu, Jun ; Lee, Jim P Y ; Li, Lingjie ; Luo, Zhi-Quan ; Wong, K. Max
Author_Institution :
TechnoCom Corp., Encino, CA, USA
Abstract :
Radar emitter classification is a special application of data clustering for classifying unknown radar emitters from received radar pulse samples. The main challenges of this task are the high dimensionality of radar pulse samples, small sample group size, and closely located radar pulse clusters. In this paper, two new online clustering algorithms are developed for radar emitter classification: One is model-based using the minimum description length (MDL) criterion and the other is based on competitive learning. Computational complexity is analyzed for each algorithm and then compared. Simulation results show the superior performance of the model-based algorithm over competitive learning in terms of better classification accuracy, flexibility, and stability.
Keywords :
computational complexity; learning (artificial intelligence); pattern clustering; radar computing; radar signal processing; signal classification; signal sampling; statistical analysis; competitive learning; computational complexity; minimum description length criterion; model-based algorithm; online clustering algorithms; radar emitter classification; radar pulse samples; Algorithm design and analysis; Classification algorithms; Clustering algorithms; Computational complexity; Computational modeling; Doppler radar; Neural networks; Pulse shaping methods; Radar applications; Radar detection; Index Terms- Emitter classification; MDL criterion; cluster validation; clustering; competitive learning; computational complexity.; online process; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Computer Systems; Information Storage and Retrieval; Models, Statistical; Numerical Analysis, Computer-Assisted; Online Systems; Pattern Recognition, Automated; Radar; Signal Processing, Computer-Assisted;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.166