DocumentCode :
939176
Title :
2006 Latin American Test Workshop
Author :
Vargas, F.
Author_Institution :
General Chair, LATW ´06
Volume :
23
Issue :
3
fYear :
2006
Firstpage :
185
Lastpage :
185
Abstract :
The author presents highlights from the 7th Annual IEEE Latin American Test Workshop (LATW ´06), held in the capital city of Buenos Aires, Argentina, 26-29 March.
Keywords :
Latin American Test Workshop; Latin American Test Workshop;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2006.58
Filename :
1634285
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=939176
