Title :
High-Temperature Microwave Characterization of Dielectric Rods (Corrections)
Author :
Araneta, J.C. ; Brojiwin, M.E. ; Kriegsmann, G.A.
fDate :
3/1/1985 12:00:00 AM
Abstract :
In the above paper, the fourth and fifth sentences in the third paragraph from the bottom of the right-half of p. 1332, should read: The bisection method is used twice; once to find the roots of G (Beta), and secondly to find the roots of F(Beta). In looking for the roots of F(Beta), the real part of the numerical value of yc- ym is monitored.
Keywords :
Computer science; Dielectric constant; Dielectric measurements; Equations; Frequency dependence; Impedance; Microstrip; Monitoring; Scattering;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1985.1133004