• DocumentCode
    939366
  • Title

    High-Temperature Microwave Characterization of Dielectric Rods (Corrections)

  • Author

    Araneta, J.C. ; Brojiwin, M.E. ; Kriegsmann, G.A.

  • Volume
    33
  • Issue
    3
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    287
  • Lastpage
    288
  • Abstract
    In the above paper, the fourth and fifth sentences in the third paragraph from the bottom of the right-half of p. 1332, should read: The bisection method is used twice; once to find the roots of G (Beta), and secondly to find the roots of F(Beta). In looking for the roots of F(Beta), the real part of the numerical value of yc- ym is monitored.
  • Keywords
    Computer science; Dielectric constant; Dielectric measurements; Equations; Frequency dependence; Impedance; Microstrip; Monitoring; Scattering;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1985.1133004
  • Filename
    1133004
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=939366