DocumentCode :
939366
Title :
High-Temperature Microwave Characterization of Dielectric Rods (Corrections)
Author :
Araneta, J.C. ; Brojiwin, M.E. ; Kriegsmann, G.A.
Volume :
33
Issue :
3
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
287
Lastpage :
288
Abstract :
In the above paper, the fourth and fifth sentences in the third paragraph from the bottom of the right-half of p. 1332, should read: The bisection method is used twice; once to find the roots of G (Beta), and secondly to find the roots of F(Beta). In looking for the roots of F(Beta), the real part of the numerical value of yc- ym is monitored.
Keywords :
Computer science; Dielectric constant; Dielectric measurements; Equations; Frequency dependence; Impedance; Microstrip; Monitoring; Scattering;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1985.1133004
Filename :
1133004
Link To Document :
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