Title :
Narrow-band measurement of differential group delay by a six-state RF phase-shift technique: 40 fs single-measurement uncertainty
Author :
Williams, P.A. ; Kofler, J.D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We describe in detail our implementation of a modulation phase shift (MPS) technique for narrow-bandwidth measurement of differential group delay (DGD) and the principal states of polarization (PSP) in optical fibers and components. Our MPS technique involves launching six orthogonal polarization states (as opposed to the four states typically launched) to achieve improved measurement stability. The measurement bandwidth is 4.92 GHz (twice the 2.46 GHz RF modulation frequency), the measurement time is 13 s per point, and the single-measurement uncertainty is better than 40 fs (∼95% confidence interval) for DGD values from 10 to 1000 fs. We demonstrate that this uncertainty can be greatly improved by averaging, yielding a 9.7 fs uncertainty (95% confidence interval) on a device with 315 fs of DGD. Sources of uncertainty are detailed, including a DGD contribution from the detector itself. Simulations illustrate the uncertainty contribution of multiple DGD elements in series.
Keywords :
delay estimation; measurement uncertainty; microwave phase shifters; optical fibre communication; optical fibre dispersion; optical fibre polarisation; optical fibre testing; optical modulation; optical phase shifters; phase shifting interferometry; 10 to 1000 fs; 315 fs; 4.92 GHz; PMD; RF modulation frequency; RF phase shift; differential group delay; measurement stability; measurement uncertainty; modulation phase shift; modulation phase shift technique; multiple DGD elements; narrow-band measurement; optical fiber components; orthogonal polarization states; polarization-mode dispersion; principal polarization states; single-measurement uncertainty; six-state RF phase-shift technique; Delay; Frequency measurement; Narrowband; Optical fiber polarization; Optical fibers; Phase measurement; Phase modulation; Radio frequency; Time measurement; Uncertainty;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2003.822116