Title :
Control of higher order leaky modes in deep-ridge waveguides and application to low-crosstalk arrayed waveguide gratings
Author :
Kohtoku, Masaki ; Hirono, Takuo ; Oku, Satoshi ; Kadota, Yoshiaki ; Shibata, Yasuo ; Yoshikuni, Yuzo
Author_Institution :
NTT Photonics Labs., NTT Corp., Kanagawa, Japan
Abstract :
In a lightwave circuit using a strongly confined waveguide, higher order leaky modes must be suppressed to obtain ideal characteristics, especially in arrayed waveguide gratings (AWGs). Propagation loss for higher order leaky modes in InP-based deep-ridge waveguides was investigated by simulation and experiment. A highly sensitive loss measurement method based on optical low-coherence reflectometry was used to determine the loss, and the relationship between the loss for the higher order mode and AWG crosstalk was investigated. Optimizing the deep-ridge waveguide parameters, especially the core thickness, the refractive index of the core, and the etch depth under the core, significantly reduced the propagation loss for the higher order leaky mode. The effective elimination of the higher order modes will enable fabrication of low-crosstalk AWG routers.
Keywords :
III-V semiconductors; arrayed waveguide gratings; indium compounds; integrated optics; optical communication equipment; optical crosstalk; optical loss measurement; optical losses; reflectometry; refractive index; ridge waveguides; semiconductor devices; InP; InP-based waveguides; core thickness; deep-ridge waveguides; etch depth; higher order leaky mode; higher order leaky modes; integrated optics; lightwave circuit; low-crosstalk AWG routers; low-crosstalk arrayed waveguide gratings; optical low coherence reflectometry; propagation loss; refractive index; semiconductor waveguides; sensitive loss measurement method; Arrayed waveguide gratings; Circuit simulation; Loss measurement; Optical arrays; Optical crosstalk; Optical losses; Optical refraction; Optical sensors; Optical waveguides; Propagation losses;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.824354