• DocumentCode
    939539
  • Title

    Estimation of polarization crosstalk at a micro-bend in Si-photonic wire waveguide

  • Author

    Sakai, Atsushi ; Fukazawa, Tatsuhiko ; Baba, Toshihiko

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
  • Volume
    22
  • Issue
    2
  • fYear
    2004
  • Firstpage
    520
  • Lastpage
    525
  • Abstract
    The singlemode Si-photonic wire waveguide allows sharp bends, which significantly expands the design flexibility of optical devices and circuits. Here, the suppression of the polarization crosstalk at a sharp bend will be an important issue, since a large crosstalk affects the performance of devices and circuits. In this study, the three-dimensional (3-D) finite-difference time-domain (FDTD) simulation showed that the crosstalk at a 90°-bend with a radius of 0.35-1.75 μm is less than -25 dB at a wavelength of 1.55 μm. In the experiment, the crosstalk from TE-like to TM-like polarization was evaluated to be -13 dB to -10 dB. This large value was explained by a small tilt of waveguide sidewalls, which seriously increased the crosstalk. In addition, it was found in the calculation that some combinations of bends increase or decrease the crosstalk, and that a U-shape bend is the most effective for the suppression of the crosstalk.
  • Keywords
    elemental semiconductors; finite difference time-domain analysis; light polarisation; optical crosstalk; optical design techniques; optical fabrication; optical losses; optical waveguides; silicon; silicon-on-insulator; FDTD; Si; Si-photonic wire waveguide; TE-like polarization; TM-like polarization; U-shape bend; design flexibility; microbend; optical devices; polarization crosstalk; three-dimensional finite-difference time-domain simulation; Circuit simulation; Crosstalk; Finite difference methods; Flexible printed circuits; Optical design; Optical devices; Optical polarization; Optical waveguides; Time domain analysis; Wire;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2004.824357
  • Filename
    1278494