Title :
Accuracy comparisons of Josephson array systems (voltage standards)
Author :
Steiner, R.L. ; Clark, A.F. ; Kiser, C. ; Witt, T.J. ; Reymann, D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaitherburg, MD, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
Five Josephson-array voltage standard systems were compared using several different methods. All of the tests were performed on a site at a 1.018-V level, either by direct connection or through successive measurements of independent voltage sources. The resulting agreement between different systems measuring the same source was generally better than 10.0 parts in 10/sup -9/, limited by source noise and detector resolution. Direct array-to-array comparisons for independent systems achieved agreement to within random uncertainties of 0.2 parts in 10/sup -9/. The basic conclusion is that Josephson-array voltage standard systems can be readily transported and tested to assure one-site equivalence. Also, these tests can be done quickly and with high precision, limited by the detector noise if directly compared, or by the transfer reference noise if done indirectly.<>
Keywords :
electron device noise; measurement standards; superconducting junction devices; voltage measurement; 1.018 V; Josephson-array voltage standard systems; array-to-array comparisons; detector noise; detector resolution; independent voltage sources; one-site equivalence; source noise; transfer reference noise; Calibration; Code standards; Hardware; Laboratories; NIST; Performance evaluation; Software testing; System software; System testing; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on