• DocumentCode
    939542
  • Title

    Accuracy comparisons of Josephson array systems (voltage standards)

  • Author

    Steiner, R.L. ; Clark, A.F. ; Kiser, C. ; Witt, T.J. ; Reymann, D.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaitherburg, MD, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1874
  • Lastpage
    1877
  • Abstract
    Five Josephson-array voltage standard systems were compared using several different methods. All of the tests were performed on a site at a 1.018-V level, either by direct connection or through successive measurements of independent voltage sources. The resulting agreement between different systems measuring the same source was generally better than 10.0 parts in 10/sup -9/, limited by source noise and detector resolution. Direct array-to-array comparisons for independent systems achieved agreement to within random uncertainties of 0.2 parts in 10/sup -9/. The basic conclusion is that Josephson-array voltage standard systems can be readily transported and tested to assure one-site equivalence. Also, these tests can be done quickly and with high precision, limited by the detector noise if directly compared, or by the transfer reference noise if done indirectly.<>
  • Keywords
    electron device noise; measurement standards; superconducting junction devices; voltage measurement; 1.018 V; Josephson-array voltage standard systems; array-to-array comparisons; detector noise; detector resolution; independent voltage sources; one-site equivalence; source noise; transfer reference noise; Calibration; Code standards; Hardware; Laboratories; NIST; Performance evaluation; Software testing; System software; System testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233315
  • Filename
    233315