DocumentCode :
939608
Title :
Nonlinear response of low temperature superconducting thin film gradiometer sense loops
Author :
Clem, T.R. ; Purpura, J.W. ; Wiegert, R.F. ; Goodman, W.L.
Author_Institution :
US Naval Surface Warfare Center, Panama City, FL, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1848
Lastpage :
1852
Abstract :
Experimental measurements of the nonlinear response of superconducting thin-film gradiometer sense loops to changes in magnetic field at 4.2 K are described. The sense loops were fabricated from niobium and niobium nitride. The basic experiment involved the ramp of a uniform magnetic field from zero up to a predetermined value. The performance of the loops was measured by means of a superconducting-quantum-interference-device (SQUID)-based readout system inductively coupled to the samples. Threshold values of external field were observed to characterize the onset of nonlinear behavior for all samples measured. The performance of the loops as measured by this onset of nonlinearity is correlated with important parameters including material, aspect ratio, edge quality, and the effect of crossovers. The empirical results are compared with predictions from an ideal diagmagnet model to describe demagnetization effects.<>
Keywords :
SQUIDs; demagnetisation; magnetometers; niobium; niobium compounds; superconducting junction devices; superconducting thin films; 4.2 K; Nb-NbN; SQUID based readout system; aspect ratio; crossovers; demagnetization effects; edge quality; ideal diagmagnet model; low temperature superconducting thin film gradiometer sense loops; magnetic field changes; nonlinear response; onset of nonlinearity; threshold external field; uniform magnetic field; Coupling circuits; Information geometry; Magnetic field measurement; Niobium; SQUID magnetometers; Sea measurements; Superconducting materials; Superconducting thin films; Temperature sensors; Testing;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233321
Filename :
233321
Link To Document :
بازگشت