DocumentCode :
939643
Title :
An optimum approach for reduction of fiber alignment shift of fiber-solder-ferrule joints in laser module packaging
Author :
Cheng, Wood-Hi ; Sheen, Maw-Tyan ; Chang, Chia-Ming ; Tseng, Yih-Tun
Author_Institution :
Inst. of Electro-Opt. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
Volume :
22
Issue :
2
fYear :
2004
Firstpage :
589
Lastpage :
594
Abstract :
The results of experimental and numerical investigations leading to an optimum approach for the reduction of fiber alignment shift of fiber-solder-ferrule (FSF) joints in laser module packaging under temperature cycling test is presented. Using a novel image capture camera system as a monitor probe and the Sn -based solders as bonding materials, we have achieved the minimum fiber eccentric offsets of 8 and 20 μm in FSF joints with the PbSn and AuSn solders, respectively. After a 500-temperature cycling test, the fiber alignment shifts for these small initial fiber eccentric offsets of FSF joints were found to be 0.7 and 0.3 μm with the PbSn and AuSn solders, respectively. The measured fiber shifts were in good agreement with the numerical results of the finite-element method (FEM) analysis when both the residual stresses and the creep deformation within the solder were considered. This study have demonstrated that by soldering the fiber near to the center of the ferrule, and hence minimizing the fiber eccentric offset, the fiber alignment shifts of FSF joints in laser diode module packaging under temperature cycling test can be reduced significantly.
Keywords :
creep; finite element analysis; image sensors; internal stresses; modules; optical fibre couplers; optical testing; packaging; soldering; solders; AuSn; FEM; FSF joints; PbSn; Sn-based solder; creep deformation; fiber alignment shift reduction; fiber eccentric offsets; fiber-solder-ferrule joints; finite element method analysis; image capture camera system; laser module packaging; residual stress; temperature cycling test; Cameras; Fiber lasers; Lead; Monitoring; Optical fiber testing; Packaging; Probes; State feedback; Temperature; Tin;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2004.824462
Filename :
1278503
Link To Document :
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