• DocumentCode
    939685
  • Title

    Improved sensitivity of planar microwave based RF-SQUIDs using a cryogenic HEMT preamplifier

  • Author

    Fontana, G. ; Mezzena, R. ; Vitale, S. ; Cerdonio, M. ; Muck, M. ; Hallmanns, G. ; Heiden, C.

  • Author_Institution
    Dipartimento di Fisica, Trento Univ., Italy
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1820
  • Lastpage
    1823
  • Abstract
    The design and performance of a planar microwave RF-SQUID (superconducting quantum interference device) read out by a cryogenic high-electron-mobility-transistor (HEMT) preamplifier are described. The SQUID sensor consists of a planar half-wavelength microstrip resonator, into which the SQUID loop is integrated. The SQUID is operated at a pump frequency of 1.7 GHz. The cryogenic preamplifier uses a microwave HEMT, located close to the SQUID sensor. Measurements of the flux noise and the fractional step rise parameter were carried out in the temperature range between 4.2 K and 1.5 K. In an open loop, a flux noise of 2*10/sup -6/ Phi /sub 0// square root Hz was measured at 4.2 K, resulting in an energy resolution of about 100 h. The design of a 3-GHz magnetometer is also described, and the preliminary results of the measurements are reported.<>
  • Keywords
    SQUIDs; electron device noise; magnetometers; microstrip components; microwave amplifiers; microwave measurement; preamplifiers; solid-state microwave circuits; superconducting microwave devices; 1.5 to 4.2 K; 1.7 GHz; 3 GHz; SQUID sensor; cryogenic HEMT preamplifier; energy resolution; flux noise; fractional step rise parameter; magnetometer; microwave HEMT; planar half-wavelength microstrip resonator; planar microwave RF-SQUID; pump frequency; 1f noise; Cryogenics; Energy measurement; HEMTs; Noise measurement; Preamplifiers; SQUIDs; Superconducting device noise; Superconducting devices; Superconducting microwave devices;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233328
  • Filename
    233328