DocumentCode
939742
Title
Octagonal washer DC SQUIDs and integrated susceptometers fabricated in a planarized sub- mu m Nb-AlO/sub x/-Nb technology
Author
Ketchen, M. ; Pearson, D.J. ; Stawiasz, K. ; Hu, C.-K. ; Kleinsasser, A.W. ; Brunner, T. ; Cabral, C. ; Chandrashekhar, V. ; Jaso, M. ; Manny, M. ; Stein, K. ; Bhushan, M.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
3
Issue
1
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
1795
Lastpage
1799
Abstract
The authors have designed, fabricated, and measured a number of Nb-AlO/sub x/-Nb octagonal washer DC superconducting quantum interference devices (SQUIDs) and miniature DC SQUID susceptometers having minimum feature size down to 0.5 mu m. With SQUID inductance values on the order of 100 pH, typical noise performance is better than 1 mu Phi /sub 0// square root Hz. The small minimum feature size of input coils and pickup loop structures will facilitate tight coupling to a wide variety of systems ranging from submicron particles and structures to conventional approximately mu H input circuits. A single-washer SQUID with an 80-turn 0.5- mu m-linewidth, 630-nH input coil has user-friendly V- Phi (voltage-flux) curves and a coupled energy sensitivity of 20 h at 4.2 K. Susceptometers with pickup loops ranging from 20- mu m to 0.8- mu m across have very user-friendly V- Phi curves and a resolution of order 100 mu /sub B// square root Hz at 4.2 K for devices with the smallest loops.<>
Keywords
SQUIDs; aluminium compounds; electron device noise; magnetometers; niobium; superconducting integrated circuits; 0.5 micron; 4.2 K; Nb-AlO/sub x/-Nb technology; PARTS; SQUID inductance; coupled energy sensitivity; input coils; integrated susceptometers; miniature DC SQUID susceptometers; minimum feature size; noise performance; octagonal washer DC superconducting quantum interference devices; pickup loop structures; submicrometre planar process; voltage flux curves; Circuit noise; Coupling circuits; Inductance; Interference; SQUIDs; Size measurement; Superconducting coils; Superconducting device noise; Superconducting devices; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.233334
Filename
233334
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