• DocumentCode
    939790
  • Title

    Critical current density, irreversibility line, and flux creep activation energy in silver-sheathed Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ superconducting tapes

  • Author

    Shi, D. ; Wang, Z. ; Sengupta, S. ; Smith, M. ; Goodrich, L.F. ; Dou, S.X. ; Liu, H.K. ; Guo, Y.C.

  • Author_Institution
    Argonne Nat. Lab., IL, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1194
  • Lastpage
    1196
  • Abstract
    Experimental transport data, magnetic hysteresis, and flux creep activation energy results are presented for silver-sheathed high-T/sub c/ Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ superconducting tapes. The 110 K superconducting phase was formed by lead doping in a Bi-Sr-Ca-Cu-O system. The transport critical current density was measured at 4.0 K to be 0.7*10/sup 5/ A/cm/sup 2/ (the corresponding critical current is 74 A) at zero field and 1.6*10/sup 4/ A/cm/sup 2/ at 12 T for H// ab. Excellent grain alignment in the a-b plane was achieved by a short-melting method, which considerably improved the critical current density and irreversibility line. Flux creep activation energy as a function of current is obtained based on the magnetic relaxation measurements.<>
  • Keywords
    bismuth compounds; calcium compounds; creep; critical current density (superconductivity); high-temperature superconductors; magnetic hysteresis; magnetic relaxation; melting; silver; strontium compounds; 110 K; 12 T; 4.0 K; Ag-Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/; HTSC; a-b plane; critical current density; flux creep activation energy; grain alignment; magnetic hysteresis; magnetic relaxation measurements; short-melting method; superconducting tapes; transport data; Bismuth; Creep; Critical current density; Current measurement; Density measurement; Doping; Magnetic field measurement; Magnetic hysteresis; Strontium; Superconducting films;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233338
  • Filename
    233338