DocumentCode
939807
Title
Design of universal test sequences for VLSI
Author
Lempel, Abraham ; Cohn, Martin
Volume
31
Issue
1
fYear
1985
fDate
1/1/1985 12:00:00 AM
Firstpage
10
Lastpage
17
Abstract
A test sequence is called 
-universal if it exercises every function depending on t or fewer inputs on a very large scale integration (VLSI) chip with 
inputs. Randomized and deterministic procedures are deseribed for the design of -universal sequences and for the signature analysis of the test outputs.
-universal if it exercises every function depending on t or fewer inputs on a very large scale integration (VLSI) chip with inputs. Randomized and deterministic procedures are deseribed for the design of -universal sequences and for the signature analysis of the test outputs.Keywords
Integrated circuit testing; Shift-register sequences; VLSI; Very large-scale integration (VLSI); Binary sequences; Computer science; Cost function; Feedback; Input variables; Logic functions; Logic testing; Shift registers; System testing; Very large scale integration;
fLanguage
English
Journal_Title
Information Theory, IEEE Transactions on
Publisher
ieee
ISSN
0018-9448
Type
jour
DOI
10.1109/TIT.1985.1057003
Filename
1057003
Link To Document