DocumentCode
939929
Title
Critical range evaluation using a diagonal flat plate
Author
Lee, Teh-hong ; Clark, Tony L. ; Burnside, Walter D. ; Gupta, Inder J.
Author_Institution
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume
40
Issue
8
fYear
1992
fDate
8/1/1992 12:00:00 AM
Firstpage
966
Lastpage
974
Abstract
A novel technique is presented to image stray signals in RCS measurement ranges. In this technique, the scattered fields of a flat plate in the diagonal plane are measured in a range for various frequencies and look angles. The scattered field data are then processed to generate an inverse synthetic aperture radar (ISAR) image of the diagonal flat plate. It is shown that scattering mechanisms associated with various stray signals can be identified by using the ISAR image. This leads to better understanding of the range and possible chamber improvements. Scattering mechanisms as small as 90 dB below the plate broadside scattered field level have been observed in the image domain due to the high directivity and low sidelobe characteristics associated with the diagonal flat plate backscattered fields. The results obtained from evaluating the two compact range facilities at the Ohio State University ElectroScience Laboratory are presented to illustrate the virtues of the range evaluation technique
Keywords
backscatter; image processing; radar cross-sections; synthetic aperture radar; ISAR image; RCS measurement ranges; backscattered fields; critical range evaluation; diagonal flat plate; inverse synthetic aperture radar; scattered fields; stray signals; Antenna accessories; Antenna measurements; Frequency measurement; Inverse synthetic aperture radar; Laboratories; Pollution measurement; Probes; Radar scattering; Senior members; Signal processing;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/8.163435
Filename
163435
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