Title :
A Novel Wafer-Level Hermetic Packaging for MEMS Devices
Author :
Tsou, Chingfu ; Li, Hungchung ; Chang, Hsing-Cheng
Author_Institution :
Feng Chia Univ., Taichung
Abstract :
Some emerging microelectromechanical systems (MEMS) devices such as high-performance inertial sensors and high-speed actuators must be operated in a high vacuum and in order to create this vacuum environment, specific packaging is required. To satisfy this demand, this paper presents a novel method for hermetic and near-vacuum packaging of MEMS devices. We use wafer-level bonding technology to combine with vacuum packaging, simultaneously. For this packaging solution, the wafers with air-guided micro-through-holes were placed on a custom-built design housed in a vacuum chamber maintained at a low-pressure environment of sub-10 mtorr. Packaging structure is then sealed by solder ball reflow process with the lower heating temperature of 300degC to fill up micro-through-hole. Experimental results shown the hermetical packaging technique using solder sealing is adapted to the wafer-level microfabrication process for MEMS devices and can achieve better yield and performance. Thus, this technique is very useful for many applications with high performance and low packaging cost can be obtained due to wafer-level processing.
Keywords :
bonding processes; hermetic seals; micromechanical devices; reflow soldering; MEMS devices; air-guided micro-through-holes; hermetical packaging technique; high-speed actuators; inertial sensors; microelectromechanical systems; near-vacuum packaging; solder ball reflow process; solder sealing; temperature 300 C; vacuum chamber; vacuum environment; wafer-level bonding technology; wafer-level hermetic packaging; wafer-level microfabrication process; wafer-level processing; Hermetic packaging; microelectromechanical system (MEMS); wafer-level;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2007.906236