Title :
The role of Sn addition on the improvement of J/sub c/ in PbMo/sub 6/S/sub 8/
Author :
Selvam, P. ; Cattani, D. ; Cors, J. ; Decroux, M. ; Niedermann, P. ; Fischer, O. ; Chevrel, R. ; Pech, T.
Author_Institution :
Dept. de Phys. de la Matiere Condensee, Geneve Univ., Switzerland
fDate :
3/1/1993 12:00:00 AM
Abstract :
The influence of Sn on the enhancement of critical current densities, J/sub c/, in bulk samples of PbMo/sub 6/S/sub 8/ has been systematically investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), Auger electron spectroscopy (AES), AC susceptibility, and specific heat experiments. The results indicate that the addition of Sn, as an adjunction (dopant) or as a substitution, has a considerable effect on the structural, superconducting, microstructural and grain boundary properties. The observed increase in J/sub c/ is discussed in terms of improved interconnectivity between the grains, better homogeneity of the samples, and, more importantly, lower grain boundary contamination.<>
Keywords :
Auger effect; X-ray diffraction examination of materials; critical current density (superconductivity); grain boundaries; lead compounds; molybdenum compounds; scanning electron microscope examination of materials; specific heat of solids; tin compounds; type II superconductors; AC susceptibility; AES; Auger electron spectroscopy; Pb/sub 1-x/Sn/sub x/Mo/sub 6/S/sub 8/; PbMo/sub 6/S/sub 8/; SEM; X-ray diffraction; adjunction; bulk samples; critical current densities; dopant; grain boundary properties; grain interconnectivity; homogeneity; lower grain boundary contamination; microstructural properties; scanning electron microscopy; specific heat; structural properties; substitution; superconducting properties; Contamination; Critical current density; Grain boundaries; Lattices; Scanning electron microscopy; Spectroscopy; Superconducting magnets; Tin; X-ray diffraction; X-ray scattering;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
