• DocumentCode
    940071
  • Title

    Frequency/stress sensitivity of s.a.w. resonators

  • Author

    Dias, J. Fleming ; Karrer, H. Edward ; Kusters, John A. ; Adams, Charles A.

  • Author_Institution
    Hewlett-Packard Laboratories, Palo Alto, USA
  • Volume
    12
  • Issue
    22
  • fYear
    1976
  • Firstpage
    580
  • Lastpage
    582
  • Abstract
    Surface-acoustic-wave resonators can be used as stress sensors for measuring force and pressure. Experiments at 160 MHz using rotated y-cut substrates indicate that larger linear changes in resonator frequency can be obtained by deforming the substrate. The s.a.w. transducers, besides being small in size, are also stable in frequency.
  • Keywords
    acoustic surface wave devices; crystal resonators; pressure transducers; stress measurement; ultrasonic transducers; SAW resonators; frequency/stress sensitivity; resonator frequency; stress sensors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19760442
  • Filename
    4240170
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=940071