DocumentCode :
940180
Title :
A Consistent Description of Scaling Law for Flux Pinning in {\\hbox {Nb}}_{3}{\\hbox {Sn}} Strands Based on the Kramer Model (Corrected)*
Author :
Oh, Sangjun ; Kim, Keeman
Author_Institution :
Korea Basic Sci. Inst., Taejeon
Volume :
17
Issue :
4
fYear :
2007
Firstpage :
3898
Lastpage :
3901
Abstract :
There are a lot of experimental reports on the scaling of flux pinning in the form of F = Fmb1/2(1 - b)2, with b = B/Bc2.The temperature dependence of Fm is approximately proportional to B´.2 , whereas the strain dependence of Fm is reported to be proportional to the upper critical field Bc2. In this work, we re-analyze our previous data with the Kramer model including the pin-breaking dynamic pinning force (Fp) for a low field region. It is shown that the extrapolated upper critical field Bc2*, strongly depend on the ratio between the mean of the parameter Kp for Fp (<Kp>) and the parameter K, for the flux line lattice shearing pinning force Fs. It is found that the strain dependence of Fm at 4.2 K is approximately proportional to (Bc2*)1.5. We further compare the data with the prediction of our recent scaling theory based on Eliashberg theory of strongly coupled superconductors. It is shown that the strain dependence of Fm at 4.2 K is proportional to BC2 5/2 kappa-2, consistent with the temperature dependence of Fm. Moreover, this model agrees reasonably well even with the data in a high compressive strain region (<-0.8%).
Keywords :
flux pinning; flux-line lattice; niobium alloys; superconducting critical field; superconducting materials; tin alloys; Eliashberg theory; Kramer model; Nb3Sn; compressive strain region; flux line lattice shearing pinning force; flux pinning; pin-breaking dynamic pinning force; scaling law; strain dependence; strongly coupled superconductors; temperature 4.2 K; upper critical field; Eliashberg theory; scaling of flux pinning; strain dependence; the Kramer model;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2007.908463
Filename :
4358065
Link To Document :
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