Title :
A CMOS oversampling bandpass cascaded D/A converter with digital FIR and current-mode semi-digital filtering
Author :
Barkin, David B. ; Lin, AndrewC Y. ; Su, David K. ; Wooley, Bruce A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
4/1/2004 12:00:00 AM
Abstract :
An oversampling bandpass digital-to-analog converter has been designed so as to eliminate the carrier leak and in-band SNR degradation that accompany I and Q channel mismatch in wireless transmitters. The converter combines a cascaded noise-shaping sigma-delta (ΣΔ) modulator with digital finite impulse response (FIR) and mixed-signal semi-digital filters that attenuate out-of-band quantization noise. The performance of the converter in the presence of current source mismatch has been improved through the use of bandpass data weighted averaging. An experimental prototype of the converter, integrated in a 0.25-μm CMOS technology, provides 83 dB of dynamic range for a 6.25-MHz signal band centered at 50 MHz, and suppresses out-of-band quantization noise by 38 dB.
Keywords :
CMOS integrated circuits; FIR filters; analogue-digital conversion; band-pass filters; current-mode circuits; digital filters; leakage currents; mixed analogue-digital integrated circuits; radio transmitters; sigma-delta modulation; 0.25 micron; 50 MHz; 6.25 MHz; CMOS oversampling bandpass cascaded D/A converter; I/Q channel mismatch; bandpass data weighted averaging; carrier leak; cascaded noise-shaping sigma-delta modulator; converter performance; current source mismatch; current-mode semi-digital filtering; digital FIR filtering; digital finite impulse response filters; digital-to-analog converter; in-band SNR degradation; mixed-signal semi-digital filters; out-of-band quantization noise attenuation; out-of-band quantization noise suppression; wireless transmitters; Band pass filters; CMOS technology; Degradation; Digital filters; Digital-analog conversion; Filtering; Finite impulse response filter; Quantization; Signal to noise ratio; Transmitters;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.825245