Title :
Resistivity Measurements of Semiconductors at 9000 MC
Author :
Allerton, G.L. ; Seifert, J.R.
Author_Institution :
Western Electric Co., Allentown, Pa.
Keywords :
Annealing; Conductivity measurement; Copper; Current measurement; Electric variables measurement; Machining; Permeability measurement; Semiconductor materials; Silver; Transmission line measurements;
Journal_Title :
Instrumentation, IRE Transactions on
DOI :
10.1109/IRE-I.1960.5006911
