DocumentCode :
940513
Title :
Microstructural characterization of Ag-sheathed Tl-Ba-Ca-Cu-O and Bi-Sr-Ca-Cu-O superconducting tapes by analytical electron microscopy
Author :
Hu, J.G. ; Miller, D.J. ; Goretta, K.C. ; Poeppel, R.B.
Author_Institution :
Argonne Nat. Lab., IL, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1215
Lastpage :
1218
Abstract :
The microstructures of Tl(1223) and Pb-doped Bi(2223) silver tapes produced by the powder-in-tube (PIT) method have been examined by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and energy dispersive spectrometry (EDS). The Tl tapes annealed below the melting point exhibited fine grains and a high density of pores while tapes subjected to partial melting prior to solid state annealing were fully dense with large grains. However, these tapes also showed an increase in the size and density of impurity particles, particularly CaO and a Ba-Cu rich phase. Silver powders added to the precursors tended to promote the growth of Tl(1223) at lower temperatures but also interfered with the development of texture by providing nucleation sites of random orientations. In contrast, the Bi(2223) tape exhibited a high degree of texture and alignment. The incorporation of silver within the superconducting phase was found to be negligible for both the Tl(1223) and Bi(2223) tapes.<>
Keywords :
annealing; barium compounds; bismuth compounds; calcium compounds; grain size; high-temperature superconductors; lead compounds; scanning electron microscope examination of materials; silver; strontium compounds; texture; thallium compounds; transmission electron microscope examination of materials; BiPbSrCaCuO-Ag; EDS; SEM; TEM; TlBa/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/-Ag; fine grains; high temperature superconductors; impurity particles; large grains; microstructures; partial melting; solid state annealing; superconducting tapes; texture; Annealing; Dispersion; Impurities; Microstructure; Powders; Scanning electron microscopy; Silver; Solid state circuits; Spectroscopy; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233407
Filename :
233407
Link To Document :
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