Title :
A single-chip optical CMOS detector with in-situ demodulating and integrating readout for next-generation optical storage systems
Author :
Hehemann, Ingo ; Brockherde, Werner ; Hofmann, Holger ; Kemna, Armin ; Hosticka, Bedrich J.
Author_Institution :
Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany
fDate :
4/1/2004 12:00:00 AM
Abstract :
In this paper, a new fully integrated detector architecture for pick-up units in optical storage systems is presented. It features a special high-frequency photodiode constellation for data recovery suitable for the needs of future optical storage systems. The functionality of standard detectors has been extended by using an additional 5 × 5 low-frequency photodiode matrix for in-situ determination of the average spatial light power distribution across the detector. The six high-frequency paths exhibit bandwidths up to 135 MHz, and the maximum clock frequency for the low-frequency paths is 20 MHz. The detector has been fabricated in a standard 0.6-μm CMOS process, and it operates at a 3.3-V power supply and occupies 1.78 × 1.58 mm2.
Keywords :
CMOS integrated circuits; integrated optoelectronics; optical disc storage; photodetectors; photodiodes; pick-ups; 0.6 micron; 3.3 V; data recovery; demodulating readout; high-frequency photodiode constellation; integrating readout; low-frequency paths; low-frequency photodiode matrix; maximum clock frequency; optical pick-up units; optical storage systems; power supply; single-chip optical CMOS detector; spatial light power distribution; transimpedance amplifier; High speed optical techniques; Integrated optics; Optical detectors; Optical recording; Optical sensors; Optical signal processing; Photodiodes; Power distribution; Signal generators; Stimulated emission;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.825260