Title :
Characteristics of Josephson junctions using the crack in YBCO thin films
Author :
Kimura, H. ; Miyazaki, M. ; Tsuda, K. ; Okabe, Y.
Author_Institution :
Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
fDate :
3/1/1993 12:00:00 AM
Abstract :
The authors studied
Keywords :
Josephson effect; barium compounds; cracks; critical current density (superconductivity); high-temperature superconductors; scanning electron microscope examination of materials; sputtered coatings; superconducting junction devices; superconducting thin films; yttrium compounds; Josephson devices; Josephson junctions; RDF magnetron sputtering; SEM; Shapiro steps; SrTiO/sub 3/ substrate; YBCO thin films; YBa/sub 2/Cu/sub 3/O/sub x/ thin film; c-axis shrinkage; cooling process; crack junctions; critical current; electric resistance; film thickness; microbridges; parallel cracks; straight cracks; tetragonal-to-orthorhombic phase transition; weak link; Cooling; Josephson junctions; Scanning electron microscopy; Substrates; Superconducting films; Surface cracks; Surface morphology; Temperature; Transistors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
