Measurement-Based Method to Characterize Parasitic Parameters of the Integrated Power Electronics Modules

Author

Yang, Liyu ; Odendaal, Willem G Hardus

Author_Institution

Semicond. Power Electron. Center, North Carolina State Univ., Raleigh, NC

Volume

22

Issue

1

fYear

2007

Firstpage

54

Lastpage

62

Abstract

A measurement-based method for extracting the parasitic parameters of active power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without destroying the structure. The linearized model is derived from impedance measurement and it is valid from low frequency to frequencies as high as 100 MHz. Extracted parameters are compared to those from commercial software and the results are in good agreement. A parallel resonance method is proposed for the characterization of common-mode capacitances

Keywords

modules; power electronics; 100 MHz; commercial software; common mode capacitance; impedance measurement; integrated power electronics modules; measurement-based method; parallel resonance method; parameter extraction; parasitic parameter characterization; Copper; Delta modulation; Electromagnetic interference; Electronics packaging; Frequency; Magnetic noise; Parasitic capacitance; Power electronics; Power measurement; Semiconductor device noise; Characterization; common-mode (CM); differential mode (DM); electromagnetic compatibility (EMC); electromagnetic interference (EMI); integrated power electronics modules (IPEMs); measurement; noise; packaging; parasitic capacitance; parasitic inductors;

fLanguage

English

Journal_Title

Power Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0885-8993

Type

jour

DOI

10.1109/TPEL.2006.886615

Filename

4052441