Title :
Measurement-Based Method to Characterize Parasitic Parameters of the Integrated Power Electronics Modules
Author :
Yang, Liyu ; Odendaal, Willem G Hardus
Author_Institution :
Semicond. Power Electron. Center, North Carolina State Univ., Raleigh, NC
Abstract :
A measurement-based method for extracting the parasitic parameters of active power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without destroying the structure. The linearized model is derived from impedance measurement and it is valid from low frequency to frequencies as high as 100 MHz. Extracted parameters are compared to those from commercial software and the results are in good agreement. A parallel resonance method is proposed for the characterization of common-mode capacitances
Keywords :
modules; power electronics; 100 MHz; commercial software; common mode capacitance; impedance measurement; integrated power electronics modules; measurement-based method; parallel resonance method; parameter extraction; parasitic parameter characterization; Copper; Delta modulation; Electromagnetic interference; Electronics packaging; Frequency; Magnetic noise; Parasitic capacitance; Power electronics; Power measurement; Semiconductor device noise; Characterization; common-mode (CM); differential mode (DM); electromagnetic compatibility (EMC); electromagnetic interference (EMI); integrated power electronics modules (IPEMs); measurement; noise; packaging; parasitic capacitance; parasitic inductors;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2006.886615
