Magnetic field dependence of critical currents of single grain boundary junctions in Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7- delta / superconductor

Author

Sarnelli, E. ; Chaudhari, P. ; Daumling, M. ; Lacey, J.A.

Author_Institution

IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2329

Lastpage

2332

Abstract

The authors present data on the magnetic field dependence of critical currents in epitaxial films of Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7- delta / containing a single boundary. The data are obtained as a function of temperature, the orientation of the grain boundary, and magnetic fields of up to 5 T. A significant residual critical current is observed which increases with decreasing angle of misorientation at a given field and temperature. The data are in qualitative accord with a model in which the grain boundary comprises a large number of microbridges in parallel.<>

Keywords

barium compounds; critical currents; grain boundaries; high-temperature superconductors; magnetic field effects; pulsed laser deposition; superconducting epitaxial layers; superconducting junction devices; superconducting thin films; yttrium compounds; 0 to 5 T; RSJ model; SrTiO/sub 3/ substrate; YBa/sub 2/Cu/sub 3/O/sub 7- delta / epitaxial films; critical currents; laser ablation; magnetic field dependence; microbridges; misorientation angle; resistively shunted junction model; single grain boundary junctions; Critical current; Current measurement; Grain boundaries; Josephson junctions; Magnetic field measurement; Magnetic fields; SQUIDs; Substrates; Superconducting epitaxial layers; Superconducting films;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233435

Filename

233435