Title :
Magnetic field dependence of critical currents of single grain boundary junctions in Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7- delta / superconductor
Author :
Sarnelli, E. ; Chaudhari, P. ; Daumling, M. ; Lacey, J.A.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
The authors present data on the magnetic field dependence of critical currents in epitaxial films of Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7- delta / containing a single boundary. The data are obtained as a function of temperature, the orientation of the grain boundary, and magnetic fields of up to 5 T. A significant residual critical current is observed which increases with decreasing angle of misorientation at a given field and temperature. The data are in qualitative accord with a model in which the grain boundary comprises a large number of microbridges in parallel.<>
Keywords :
barium compounds; critical currents; grain boundaries; high-temperature superconductors; magnetic field effects; pulsed laser deposition; superconducting epitaxial layers; superconducting junction devices; superconducting thin films; yttrium compounds; 0 to 5 T; RSJ model; SrTiO/sub 3/ substrate; YBa/sub 2/Cu/sub 3/O/sub 7- delta / epitaxial films; critical currents; laser ablation; magnetic field dependence; microbridges; misorientation angle; resistively shunted junction model; single grain boundary junctions; Critical current; Current measurement; Grain boundaries; Josephson junctions; Magnetic field measurement; Magnetic fields; SQUIDs; Substrates; Superconducting epitaxial layers; Superconducting films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
