DocumentCode
941089
Title
The Skin-Effect at High Frequencies
Author
Waldow, Peter ; Wolff, Ingo
Volume
33
Issue
10
fYear
1985
fDate
10/1/1985 12:00:00 AM
Firstpage
1076
Lastpage
1082
Abstract
During the last years, monolithic integrated circuits have been used more and more in microwave techniques. As a result, the metallization thickness of the planar circuits became of the order of the skin depth even at very high frequencies, so that the approximate methods for loss calculations used until recently must be revised. In this paper, a variational formulation of the skin-effect problem for calculating the losses as well as the inner inductances of components in such circuits will be described, and the first numerical results of the method will be discussed.
Keywords
Conducting materials; Conductors; Frequency; Hybrid integrated circuits; Integrated circuit metallization; MMICs; Microwave integrated circuits; Microwave theory and techniques; Monolithic integrated circuits; Strips;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1985.1133172
Filename
1133172
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