Title :
Refractive-index profiles of stress-induced (embossed) optical waveguides
Author_Institution :
Telecom Australia, Research Laboratories, Melbourne, Australia
Abstract :
Low-loss stress-induced light guides have been fabricated by an embossing process. The results of interferometric and near-field scan measurements of the refractive index profile of these waveguides are presented.
Keywords :
optical waveguides; refractive index; embossed optical waveguides; refractive index profiles; stress induced optical waveguides;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19770036
