DocumentCode :
941307
Title :
Current gain of graded AlGaAs/GaAs heterojunction bipolar transistors with and without a base quasi-electric field
Author :
Liu, William ; Costa, Damian ; Harris, James S., Jr.
Author_Institution :
Solid State Lab., Stanford Univ., CA, USA
Volume :
39
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
2422
Lastpage :
2429
Abstract :
Graded AlGaAs/GaAs heterojunction bipolar transistors with and without a base quasi-electric field are fabricated to investigate the various components of base current. The experimental results demonstrate that the base current for devices with extrinsic base surface passivation is dominated by base-emitter space-charge recombination current, rather than base bulk recombination current. Both a simple theoretical calculation and SEDAN (semiconductor device analysis) simulations are used to support this finding. SEDAN simulations also indicate strong effects of hole barrier lowering which reduces device current gain when the current gain approaches values of 1000 and when the maximum aluminum composition in the AlGaAs emitter is ⩽30%. The experimental finding that space-charge recombination current dominates the base current in passivated graded HBTs agrees well with published theoretical work. This work and other published experimental and theoretical works are compared and discussed
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; passivation; semiconductor device models; AlGaAs-GaAs; SEDAN simulations; base current; base quasi-electric field; base-emitter space-charge recombination current; current gain; experimental results; extrinsic base surface passivation; graded HBTs; heterojunction bipolar transistors; hole barrier lowering; semiconductor device analysis; semiconductors; Aluminum; Analytical models; Bipolar transistors; Gallium arsenide; Heterojunction bipolar transistors; Laboratories; Passivation; Radiative recombination; Semiconductor devices; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.163447
Filename :
163447
Link To Document :
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