DocumentCode :
941371
Title :
Broad-Band Permittivity Measurements Using the Semi-Automatic Network Analyzer (Short Paper)
Author :
Ness, John
Volume :
33
Issue :
11
fYear :
1985
fDate :
11/1/1985 12:00:00 AM
Firstpage :
1222
Lastpage :
1226
Abstract :
This paper outlines the use of the network analyzer to measure the dielectric properties of materials over a broad frequency range. The method described here is based on transmission techniques with simple procedures for obtaining initial estimates and unambiguous solutions for the dielectric parameters. A further feature is that this measurement technique provides a degree of self-checking for inconsistent results.
Keywords :
Calibration; Coaxial components; Couplers; Couplings; Dielectric losses; Dielectric materials; Dielectric measurements; Erbium; Microstrip; Permittivity measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1985.1133198
Filename :
1133198
Link To Document :
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