Title :
Broad-Band Permittivity Measurements Using the Semi-Automatic Network Analyzer (Short Paper)
fDate :
11/1/1985 12:00:00 AM
Abstract :
This paper outlines the use of the network analyzer to measure the dielectric properties of materials over a broad frequency range. The method described here is based on transmission techniques with simple procedures for obtaining initial estimates and unambiguous solutions for the dielectric parameters. A further feature is that this measurement technique provides a degree of self-checking for inconsistent results.
Keywords :
Calibration; Coaxial components; Couplers; Couplings; Dielectric losses; Dielectric materials; Dielectric measurements; Erbium; Microstrip; Permittivity measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1985.1133198